Axes de recherche
Axis 1 – Robust and Fast Short Circuit detection for MOSFET SiC Gate Driver
Technological barrier : Short-circuit detection method too low for WBG, presence of external DESAT component
Key parameters : WBG transistor with very fast turn-on / turn-off (100V/ns, 10A/ns)
Studies : Robust and Fast detection of Short-Circuit event at the IC Gate Driver level
Diagnostic using local Gate Driver signals
Optimized circuit implementation (driver & power die, PCB parasitic mitigation)
Recent NXP product
![recent nxp product recent nxp product](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/recent-nxp-product.jpg)
CMOS Integrated Circuit providing
new detection strategy opportunities & fast response
![CMOS integrated circuit CMOS integrated circuit](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/CMOS-integrated-circuit.jpg)
Optimized board implementation
![Optimized board implementation Optimized board implementation](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/Optimized-board-implementation.jpg)
Large bandwidth & fast response
![Large bandwidth fast response Large bandwidth fast response](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/Large-bandwidth-fast-response.jpg)
Axis 2-a) : Operational safety for EV powertrain (Charger, isolated DC / DC, Inverter)
Technological barrier : Fail-operational powertrain for Road Vehicles
Key parameters : 400 to 800V Li-Ion battery, high charge rate, 12 to 48V system
Studies : Solutions topology dependent (state-of-art ongoing)
400V fast charge, 12V or 24V applications, Si / SiC / GaN semiconductors
HV to few volts isolated DCDC Direct Conversion
DC/AC multi-leg inverter, fault tolerant, reconfiguration on-the-fly, default isolation
Centralized vs. distributed control strategies
3ph Combined Charging Unit
![3ph phase combined charging unit 3ph phase combined charging unit](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/3ph-phase-combined-charging-unit.png)
Isolated Phase Shifted Full Bridge
![isolated phase shifted full bridge isolated phase shifted full bridge](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/isolated-phase.png)
Axis 2-b) : PMIC High efficiency & Functional Safety
Technological barrier : Low cost, small size, uninterruptible µprocessor power supply
Key parameters : Fast time response, large bandwidth, µP supply voltage high accuracy
Studies : Multicellular topologies of converter for VRM
90V/1.3V direct conversion
Centralized vs. distributed control strategies
NEW Masterless IP
Decentralized
& Fail Operational
![new masterless ip new masterless ip](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/new-masterless-ip.png)
New decentralized control gives advantage:
- Fail Operational : Keep working while some phases are failing
- Discretize Power : allow more scalability
- Simplify : remove master
Combining strengths of high power efficiency
and system functional safety
Extend concept to avoid Single point failure
Goal : Fail Operational Supply of S32V25x & S32Ax – self detection & power optimization
Discretized Power for system modularity : easy reconfiguration & safe
![multiphase converter multiphase converter](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/multiphase-converter.png)
5-cell GaN-based multiphase converter
using decentralized controllers in each phase
Optimized board implementation
![scalability scalability](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/scalability-1.png)
Efficiency vs Output Current for different number of active cells N (48V /12V application).
Reconfigurability
![reconfigurability reconfigurability](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/reconfigurability.png)
Dynamic reconfiguration: from 4 to 3 active phases (2A/div; 2V/div; 200us/div)
Axis 3: EMC/EFT-aware architecture and design, from IC to module
Technological barrier : Ensure immunity to RF disturbance and maintain performance level and cost
Key parameters : High immunity to EMI and EFT, low RF emission, low cost, high performance (accuracy), Robustness
Studies : – Architecture and design of battery management system (BMS) integrated circuit (IC) to improve its immunity to electromagnetic disturbances and its emission
– Minimize the number of external filtering devices
– Develop models and simulation test bench to predict RF and ESD immunity
ESD network 1st GEN of BMS
![esd network esd network](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/esd-network-1.png)
Test of robustness vs EFT
during hot plug connections
![test robustness eft test robustness eft](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/test-robustness-eft.png)
Stacks cells are plugged randomly, Each capacitor in parallel with the battery can discharge in the IC and create damage. Hundreds of combinations tested with 14 cells.
Test of robustness vs EFT
during hot plug connections
![ESD-BMS ESD-BMS](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/ESD-BMS-1.png)
TLP curves of ESD network for BMS from 10V to 90V with stack battery cells 100nS square pulse until 3A
EMC tests for Automotive
![EMC-automotive EMC-automotive](https://www.sema.cnrs.fr/wp-content/uploads/2021/04/EMC-automotive.png)
Conducted Emission investigations of a BMS IC, in a Faraday cage